MXD6125Q

Ultra High Performance +/- 1g Dual Axis Accelerometer with Digital Outputs

Features

Ultra Low Noise 0.13 mg/ typical
Ultra Low Offset Drift 0.1 mg/ typical
Resolution better than 1 mg
Monolithic CMOS IC
On chip mixed signal processing
50,000 g shock survival rating
Low profile LCC package
2.7V to 3.6V single supply
No adjustment needed outside

Application

• Automotive
  Vehicle Security/Active Suspension/ABS/ Headlight Angle Control/Tilt Sensing
  
• Security
  Gas Line/Elevator/Fatigue Sensing
  
• Office Equipment
  Computer Peripherals/PDA's/Mouse/ Smart Pens/Cell Phones
  
• Gaming
  Joystick/RF Interface/Menu Selection/Tilt Sensing
  

General Description

The MXD6125Q is a low noise, low profile, dual axis accelerometer fabricated on a standard CMOS process. It is a complete sensing system with on-chip mixed mode signal processing. The MXD6125Q measures acceleration with a full-scale range of +/- 1 g and a sensitivity of 12.5%/g @3V at 25°. It can measure both dynamic acceleration (e.g., vibration) and static acceleration (e.g., gravity). The MXD6125Q design is based on heat convection and requires no solid proof mass. This eliminates stiction and particle issues normally found with capacitive based technology, and significantly lowers field failure rate and in-line loss due to handling during assembly.

The MXD6125Q provides two ratiometric analog outputs. The maximum noise floor is 0.18 mg/allowing signals below 0.5 mg to be resolved at 1 Hz bandwidth and the 3dB rolloff of the device occurs at 8 Hz. The MXD6125Q is available in a hermetically sealed low profile LCC surface mount package measuring 5mm x 5mm x 1.55m.